Scanning Probe Microscopy (SPM):
The scanning probe microscopy is a general term for a wide variety of microscopic
techniques, which measure the morphology and properties of surfaces on the atomic scale.
This includes the following:
Scanning Tunneling Microscopy (STM) – which studies the surface topography and electronic
structure, Atomic Force Microscopy (AFM) – which studies the surface topography, surface
hardness and elastic modulus, Lateral Force Microscopy (LFM) – which studies the relative
frictional properties, Scanning Thermal Microscopy (SThM) – which studies the thermal
conductivity, Magnetic Force & Electric Force Microscopies (MFM & EFM) – which study
the magnetic and electric properties.
The techniques of STM and AFM are discussed below, since these are widely used:
Principle: The general principle for all the scanning probe microscopes is that a sharper
probe (or a very fine tip) is used to scan the surface of the sample with much lower force and
obtain the topography and morphology information.
Scanning tunneling microscope: When a sharp tip made of a conducting material is brought
close to a conducting sample, overlapping of the electron clouds between the two surfaces
will occur. If a potential is given between them a current of electrons is formed, which is
often referred as “tunneling” current, and the effect is known as “tunneling” effect. This
effect is largely depended on the distance between the tip and the sample material. Hence, if
the scanning tip is controlled by a high precision motion device made of piezo-electric
material, the distance between the tip and the sample can be measured during a scanning
through a feedback loop control of the piezo-electric element. By this way the sample can be
scanned with sub-angstrom precision.
Atomic force microscope: This technique operates by measuring the forces between the
sample and the tip, and the sample need not be a conducting material. Here, the tip is brought
close enough to the sample surface to detect the repulsive force between the atoms of the tip
material and the sample. The probe tip is mounted at the end of a cantilever of a low spring
constant and the tip-to-sample spacing is held fixed by maintaining a constant and very low
force on the cantilever. Hence, if the tip is brought close to the sample surface, the repulsive
force will induce a bending of the cantilever. This bending can be detected by a laser beam,
which is reflected off the back of the cantilever. Thus by monitoring the deflection of the
cantilever, the surface topography of the sample can be tracked. Since the force maintained
on the cantilever is in the range of inter-atomic forces (about 10-9
Newton), this technique
derived the name “atomic force” microscopy.
AFM operates at two modes:
Repulsive or contact mode – which detects the repulsive forces between the tip and sample;
Attractive or non-contact mode – which detects the van der waals forces that act between the
tip and sample.
Instrumentation:
Scanning tunneling microscope: It mainly consists of a scanner, probe motion sensor
composed of piezo-electric material, micro probe, etc.
Atomic force microscope: It mainly consists of a scanner, cantilever, laser source, photo-
diode detector, micro-probe, etc.
Applications: Both STM and AFM find applications widely in material sciences especially
for surface studies on a nano scale range. While STM finds its applications in the
characterization of surface structure (including the electronic structure), AFM finds its
applications in measuring the hardness of materials. Sometimes, AFM can be used in the
study of “depth profile” of the deposited oxide layer on to a material.
Disadvantages: A limitation to STM is that it can study only the conducting samples, since
the technique is based on the tunneling current between two conducting areas. Hence, it
doesn’t lend itself to the study of non-conducting materials. In fact, the AFM had been
developed to encounter this problem. These methods require special sample preparation
techniques, which are tedious, like, thin sectioning, electo-polishing, various mechanical
cutting and polishing techniques, etc.